Quantified contribution of design for manufacturing to yield at 28nm - researchr publication authors

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Thomas Herrmann, Shobhit Malik, Sriram Madhavan. Quantified contribution of design for manufacturing to yield at 28nm. In Giorgio Di Natale, editor, 19th IEEE European Test Symposium, ETS 2014, Paderborn, Germany, May 26-30, 2014. pages 1-6, IEEE, 2014. [doi]

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