Thomas Herrmann, Shobhit Malik, Sriram Madhavan. Quantified contribution of design for manufacturing to yield at 28nm. In Giorgio Di Natale, editor, 19th IEEE European Test Symposium, ETS 2014, Paderborn, Germany, May 26-30, 2014. pages 1-6, IEEE, 2014. [doi]
@inproceedings{HerrmannMM14,
title = {Quantified contribution of design for manufacturing to yield at 28nm},
author = {Thomas Herrmann and Shobhit Malik and Sriram Madhavan},
year = {2014},
doi = {10.1109/ETS.2014.6847815},
url = {http://dx.doi.org/10.1109/ETS.2014.6847815},
researchr = {https://researchr.org/publication/HerrmannMM14},
cites = {0},
citedby = {0},
pages = {1-6},
booktitle = {19th IEEE European Test Symposium, ETS 2014, Paderborn, Germany, May 26-30, 2014},
editor = {Giorgio Di Natale},
publisher = {IEEE},
}