Kim Herzig. Using Pre-Release Test Failures to Build Early Post-Release Defect Prediction Models. In 25th IEEE International Symposium on Software Reliability Engineering, ISSRE 2014, Naples, Italy, November 3-6, 2014. pages 300-311, IEEE, 2014. [doi]
@inproceedings{Herzig14-0,
title = {Using Pre-Release Test Failures to Build Early Post-Release Defect Prediction Models},
author = {Kim Herzig},
year = {2014},
doi = {10.1109/ISSRE.2014.21},
url = {http://dx.doi.org/10.1109/ISSRE.2014.21},
researchr = {https://researchr.org/publication/Herzig14-0},
cites = {0},
citedby = {0},
pages = {300-311},
booktitle = {25th IEEE International Symposium on Software Reliability Engineering, ISSRE 2014, Naples, Italy, November 3-6, 2014},
publisher = {IEEE},
isbn = {978-1-4799-6032-3},
}