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Using Pre-Release Test Failures to Build Early Post-Release Defect Prediction Models

Kim Herzig. Using Pre-Release Test Failures to Build Early Post-Release Defect Prediction Models. In 25th IEEE International Symposium on Software Reliability Engineering, ISSRE 2014, Naples, Italy, November 3-6, 2014. pages 300-311, IEEE, 2014. [doi]

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