Prediction of the Impact of Thermal Cycling on Machine Lifetime Based on Accelerated Life Testing and Finite Element Analysis

David A. Hewitt, Jiabin Wang. Prediction of the Impact of Thermal Cycling on Machine Lifetime Based on Accelerated Life Testing and Finite Element Analysis. In IECON 2021 - 47th Annual Conference of the IEEE Industrial Electronics Society, Toronto, ON, Canada, October 13-16, 2021. pages 1-6, IEEE, 2021. [doi]

Abstract

Abstract is missing.