Ingrid Heynderickx, Huib de Ridder. From image quality to atmosphere experience: how evolutions in technology impact experience assessment. In Bernice E. Rogowitz, Thrasyvoulos N. Pappas, Huib de Ridder, editors, Human Vision and Electronic Imaging XVIII, Burlingame, California, USA, February 4-7, 2013. Volume 8651 of SPIE Proceedings, SPIE, 2013. [doi]
Abstract is missing.