Jeffrey L. Hieb, James H. Graham, Jian Guan. An Ontology for Identifying Cyber Intrusion Induced Faults in Process Control Systems. In Charles C. Palmer, Sujeet Shenoi, editors, Critical Infrastructure Protection III - Third Annual IFIP WG 11.10 International Conference on Critical Infrastructure Protection, Hanover, New Hampshire, USA, March 23-25, 2009, Revised Selected Papers. Volume 311 of IFIP Advances in Information and Communication Technology, pages 125-138, Springer, 2009. [doi]
Abstract is missing.