Partially Parallel Scan Chain for Test Length Reduction by Using Retiming Technique - researchr publication authors

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Yoshinobu Higami, Seiji Kajihara, Kozo Kinoshita. Partially Parallel Scan Chain for Test Length Reduction by Using Retiming Technique. In 5th Asian Test Symposium (ATS 96), November 20-22, 1996, Hsinchu, Taiwan. pages 94-99, IEEE Computer Society, 1996. [doi]

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