Yoshinobu Higami, Yosuke Kurose, Satoshi Ohno, Hironori Yamaoka, Hiroshi Takahashi, Yoshihiro Shimizu, Takashi Aikyo, Yuzo Takamatsu. Diagnostic test generation for transition faults using a stuck-at ATPG tool. In Gordon W. Roberts, Bill Eklow, editors, 2009 IEEE International Test Conference, ITC 2009, Austin, TX, USA, November 1-6, 2009. pages 1-9, IEEE, 2009. [doi]
@inproceedings{HigamiKOYTSAT09,
title = {Diagnostic test generation for transition faults using a stuck-at ATPG tool},
author = {Yoshinobu Higami and Yosuke Kurose and Satoshi Ohno and Hironori Yamaoka and Hiroshi Takahashi and Yoshihiro Shimizu and Takashi Aikyo and Yuzo Takamatsu},
year = {2009},
doi = {10.1109/TEST.2009.5355681},
url = {http://dx.doi.org/10.1109/TEST.2009.5355681},
researchr = {https://researchr.org/publication/HigamiKOYTSAT09},
cites = {0},
citedby = {0},
pages = {1-9},
booktitle = {2009 IEEE International Test Conference, ITC 2009, Austin, TX, USA, November 1-6, 2009},
editor = {Gordon W. Roberts and Bill Eklow},
publisher = {IEEE},
isbn = {978-1-4244-4868-5},
}