Tim Higgins. Digital Signal Processing for Production Testing of Analog LSI Devices. In Proceedings International Test Conference 1982, Philadelphia, PA, USA, November 1982. pages 447-457, IEEE Computer Society, 1982.
@inproceedings{Higgins82,
title = {Digital Signal Processing for Production Testing of Analog LSI Devices},
author = {Tim Higgins},
year = {1982},
tags = {testing},
researchr = {https://researchr.org/publication/Higgins82},
cites = {0},
citedby = {0},
pages = {447-457},
booktitle = {Proceedings International Test Conference 1982, Philadelphia, PA, USA, November 1982},
publisher = {IEEE Computer Society},
}