Development of the electrical deterioration sensor for appliance

Toshiyasu Higuma, Yuki Ogawa. Development of the electrical deterioration sensor for appliance. In IEEE International Conference on Consumer Electronics, ICCE 2015, Las Vegas, NV, USA, January 9-12, 2015. pages 435-436, IEEE, 2015. [doi]

Authors

Toshiyasu Higuma

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Yuki Ogawa

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