Toshiyasu Higuma, Yuki Ogawa. Development of the electrical deterioration sensor for appliance. In IEEE International Conference on Consumer Electronics, ICCE 2015, Las Vegas, NV, USA, January 9-12, 2015. pages 435-436, IEEE, 2015. [doi]
@inproceedings{HigumaO15,
title = {Development of the electrical deterioration sensor for appliance},
author = {Toshiyasu Higuma and Yuki Ogawa},
year = {2015},
doi = {10.1109/ICCE.2015.7066476},
url = {https://doi.org/10.1109/ICCE.2015.7066476},
researchr = {https://researchr.org/publication/HigumaO15},
cites = {0},
citedby = {0},
pages = {435-436},
booktitle = {IEEE International Conference on Consumer Electronics, ICCE 2015, Las Vegas, NV, USA, January 9-12, 2015},
publisher = {IEEE},
isbn = {978-1-4799-7543-3},
}