D. Hill, X. Blasco, M. Porti, M. Nafría, X. Aymerich. Characterising the surface roughness of AFM grown SiO::2:: on Si. Microelectronics Reliability, 41(7):1077-1079, 2001. [doi]
@article{HillBPNA01,
title = {Characterising the surface roughness of AFM grown SiO::2:: on Si},
author = {D. Hill and X. Blasco and M. Porti and M. Nafría and X. Aymerich},
year = {2001},
doi = {10.1016/S0026-2714(01)00078-6},
url = {http://dx.doi.org/10.1016/S0026-2714(01)00078-6},
researchr = {https://researchr.org/publication/HillBPNA01},
cites = {0},
citedby = {0},
journal = {Microelectronics Reliability},
volume = {41},
number = {7},
pages = {1077-1079},
}