Stochastic LUT-based reliability-aware design method for operation point dependent CMOS circuits

Theodor Hillebrand, Nico Hellwege, Maike Taddiken, Konstantin Tscherkaschin, Steffen Paul, Dagmar Peters-Drolshagen. Stochastic LUT-based reliability-aware design method for operation point dependent CMOS circuits. In 2016 MIXDES - 23rd International Conference Mixed Design of Integrated Circuits and Systems, Lodz, Poland, June 23-25, 2016. pages 363-368, IEEE, 2016. [doi]

@inproceedings{HillebrandHTTPP16,
  title = {Stochastic LUT-based reliability-aware design method for operation point dependent CMOS circuits},
  author = {Theodor Hillebrand and Nico Hellwege and Maike Taddiken and Konstantin Tscherkaschin and Steffen Paul and Dagmar Peters-Drolshagen},
  year = {2016},
  doi = {10.1109/MIXDES.2016.7529766},
  url = {http://dx.doi.org/10.1109/MIXDES.2016.7529766},
  researchr = {https://researchr.org/publication/HillebrandHTTPP16},
  cites = {0},
  citedby = {0},
  pages = {363-368},
  booktitle = {2016 MIXDES - 23rd International Conference Mixed Design of Integrated Circuits and Systems, Lodz, Poland, June 23-25, 2016},
  publisher = {IEEE},
  isbn = {978-83-63578-09-1},
}