Stochastic LUT-based reliability-aware design method for operation point dependent CMOS circuits

Theodor Hillebrand, Nico Hellwege, Maike Taddiken, Konstantin Tscherkaschin, Steffen Paul, Dagmar Peters-Drolshagen. Stochastic LUT-based reliability-aware design method for operation point dependent CMOS circuits. In 2016 MIXDES - 23rd International Conference Mixed Design of Integrated Circuits and Systems, Lodz, Poland, June 23-25, 2016. pages 363-368, IEEE, 2016. [doi]

Abstract

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