Rin Hirakawa, Keitaro Tominaga, Yoshihisa Nakatoh. Study on Automatic Defect Report Classification System with Self Attention Visualization. In 2020 IEEE International Conference on Consumer Electronics (ICCE), Las Vegas, NV, USA, January 4-6, 2020. pages 1-2, IEEE, 2020. [doi]
@inproceedings{HirakawaTN20,
title = {Study on Automatic Defect Report Classification System with Self Attention Visualization},
author = {Rin Hirakawa and Keitaro Tominaga and Yoshihisa Nakatoh},
year = {2020},
doi = {10.1109/ICCE46568.2020.9043062},
url = {https://doi.org/10.1109/ICCE46568.2020.9043062},
researchr = {https://researchr.org/publication/HirakawaTN20},
cites = {0},
citedby = {0},
pages = {1-2},
booktitle = {2020 IEEE International Conference on Consumer Electronics (ICCE), Las Vegas, NV, USA, January 4-6, 2020},
publisher = {IEEE},
isbn = {978-1-7281-5186-1},
}