Study on Automatic Defect Report Classification System with Self Attention Visualization

Rin Hirakawa, Keitaro Tominaga, Yoshihisa Nakatoh. Study on Automatic Defect Report Classification System with Self Attention Visualization. In 2020 IEEE International Conference on Consumer Electronics (ICCE), Las Vegas, NV, USA, January 4-6, 2020. pages 1-2, IEEE, 2020. [doi]

Abstract

Abstract is missing.