Yushiro Hiramoto, Satoshi Ohtake, Hiroshi Takahashi. A Built-In Self-Diagnostic Mechanism for Delay Faults Based on Self-Generation of Expected Signatures. In 28th IEEE Asian Test Symposium, ATS 2019, Kolkata, India, December 10-13, 2019. pages 31-36, IEEE, 2019. [doi]
@inproceedings{HiramotoOT19,
title = {A Built-In Self-Diagnostic Mechanism for Delay Faults Based on Self-Generation of Expected Signatures},
author = {Yushiro Hiramoto and Satoshi Ohtake and Hiroshi Takahashi},
year = {2019},
doi = {10.1109/ATS47505.2019.000-4},
url = {https://doi.org/10.1109/ATS47505.2019.000-4},
researchr = {https://researchr.org/publication/HiramotoOT19},
cites = {0},
citedby = {0},
pages = {31-36},
booktitle = {28th IEEE Asian Test Symposium, ATS 2019, Kolkata, India, December 10-13, 2019},
publisher = {IEEE},
isbn = {978-1-7281-2695-1},
}