Junichi Hirase. Study on the Costs of On-site VLSI Testing. In Proceedings IEEE International Test Conference 1995, Driving Down the Cost of Test, Washington, DC, USA, October 21-25, 1995. pages 438-443, IEEE Computer Society, 1995.
@inproceedings{Hirase95a,
title = {Study on the Costs of On-site VLSI Testing},
author = {Junichi Hirase},
year = {1995},
tags = {testing},
researchr = {https://researchr.org/publication/Hirase95a},
cites = {0},
citedby = {0},
pages = {438-443},
booktitle = {Proceedings IEEE International Test Conference 1995, Driving Down the Cost of Test, Washington, DC, USA, October 21-25, 1995},
publisher = {IEEE Computer Society},
isbn = {0-7803-2992-9},
}