Subblock-Level Matching Layout for Analog Block-Pair and Its Layout-Dependent Manufacturability Evaluation

Takuya Hirata, Ryuta Nishino, Shigetoshi Nakatake, Masaya Shimoyama, Masashi Miyagawa, Ryoichi Miyauchi, Koichi Tanno, Akihiro Yamada. Subblock-Level Matching Layout for Analog Block-Pair and Its Layout-Dependent Manufacturability Evaluation. IEICE Transactions, 99-A(7):1381-1389, 2016. [doi]

Abstract

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