Masayuki Hirayama, Tetsuya Yamamoto, Jiro Okayasu, Osamu Mizuno, Tohru Kikuno. Elimination of Crucial Faults by a New Selective Testing Method. In 2002 International Symposium on Empirical Software Engineering (ISESE 2002), 3-4 October 2002, Nara, Japan. pages 183-194, IEEE Computer Society, 2002. [doi]
Abstract is missing.