Outstanding Bit Error Tolerance of Resistive RAM-Based Binarized Neural Networks - researchr publication authors

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Tifenn Hirtzlin, Marc Bocquet, J.-O. Klein, Etienne Nowak, Elisa Vianello, Jean Michel Portal, Damien Querlioz. Outstanding Bit Error Tolerance of Resistive RAM-Based Binarized Neural Networks. In IEEE International Conference on Artificial Intelligence Circuits and Systems, AICAS 2019, Hsinchu, Taiwan, March 18-20, 2019. pages 288-292, IEEE, 2019. [doi]

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