Outstanding Bit Error Tolerance of Resistive RAM-Based Binarized Neural Networks

Tifenn Hirtzlin, Marc Bocquet, J.-O. Klein, Etienne Nowak, Elisa Vianello, Jean Michel Portal, Damien Querlioz. Outstanding Bit Error Tolerance of Resistive RAM-Based Binarized Neural Networks. In IEEE International Conference on Artificial Intelligence Circuits and Systems, AICAS 2019, Hsinchu, Taiwan, March 18-20, 2019. pages 288-292, IEEE, 2019. [doi]

@inproceedings{HirtzlinBKNVPQ19,
  title = {Outstanding Bit Error Tolerance of Resistive RAM-Based Binarized Neural Networks},
  author = {Tifenn Hirtzlin and Marc Bocquet and J.-O. Klein and Etienne Nowak and Elisa Vianello and Jean Michel Portal and Damien Querlioz},
  year = {2019},
  doi = {10.1109/AICAS.2019.8771544},
  url = {https://doi.org/10.1109/AICAS.2019.8771544},
  researchr = {https://researchr.org/publication/HirtzlinBKNVPQ19},
  cites = {0},
  citedby = {0},
  pages = {288-292},
  booktitle = {IEEE International Conference on Artificial Intelligence Circuits and Systems, AICAS 2019, Hsinchu, Taiwan, March 18-20, 2019},
  publisher = {IEEE},
  isbn = {978-1-5386-7884-8},
}