Sameer Hiware, Pradyot Porwal, Rajbabu Velmurugan, Subhasis Chaudhuri. Modeling of PSF for refractive index variation in fluorescence microscopy. In Benoît Macq, Peter Schelkens, editors, 18th IEEE International Conference on Image Processing, ICIP 2011, Brussels, Belgium, September 11-14, 2011. pages 2037-2040, IEEE, 2011. [doi]
@inproceedings{HiwarePVC11,
title = {Modeling of PSF for refractive index variation in fluorescence microscopy},
author = {Sameer Hiware and Pradyot Porwal and Rajbabu Velmurugan and Subhasis Chaudhuri},
year = {2011},
doi = {10.1109/ICIP.2011.6115879},
url = {http://dx.doi.org/10.1109/ICIP.2011.6115879},
researchr = {https://researchr.org/publication/HiwarePVC11},
cites = {0},
citedby = {0},
pages = {2037-2040},
booktitle = {18th IEEE International Conference on Image Processing, ICIP 2011, Brussels, Belgium, September 11-14, 2011},
editor = {Benoît Macq and Peter Schelkens},
publisher = {IEEE},
isbn = {978-1-4577-1304-0},
}