Sameer Hiware, Pradyot Porwal, Rajbabu Velmurugan, Subhasis Chaudhuri. Modeling of PSF for refractive index variation in fluorescence microscopy. In Benoît Macq, Peter Schelkens, editors, 18th IEEE International Conference on Image Processing, ICIP 2011, Brussels, Belgium, September 11-14, 2011. pages 2037-2040, IEEE, 2011. [doi]
Abstract is missing.