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Effect of interface traps for ultra-thin high-k gate dielectric based MIS devices on the capacitance-voltage characteristics

Slah Hlali, Neila Hizem, Liviu Militaru, A. Kalboussi, Abdelkader Souifi. Effect of interface traps for ultra-thin high-k gate dielectric based MIS devices on the capacitance-voltage characteristics. Microelectronics Reliability, 75:154-161, 2017. [doi]

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