An Evaluation of the 2816 EEPROM

Eugene R. Hnatek, Beau R. Wilson Jr.. An Evaluation of the 2816 EEPROM. In Proceedings International Test Conference 1982, Philadelphia, PA, USA, November 1982. pages 225-235, IEEE Computer Society, 1982.

Authors

Eugene R. Hnatek

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Beau R. Wilson Jr.

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