Robust test pattern generation for hold-time faults in nanometer technologies - researchr publication authors

researchr

You are not signed in
Sign in
Sign up

Yu-Hao Ho, Yo-Wei Chen, Chih-Ming Chang, Kai-Chieh Yang, James Chien-Mo Li. Robust test pattern generation for hold-time faults in nanometer technologies. In 2017 International Symposium on VLSI Design, Automation and Test, VLSI-DAT 2017, Hsinchu, Taiwan, April 24-27, 2017. pages 1-4, IEEE, 2017. [doi]

This author has not been identified. Look up 'Yu-Hao Ho' in GoogleThis author has not been identified. Look up 'Yo-Wei Chen' in GoogleThis author has not been identified. Look up 'Chih-Ming Chang' in GoogleThis author has not been identified. Look up 'Kai-Chieh Yang' in GoogleThis author has not been identified. Look up 'James Chien-Mo Li' in Google

runs on WebDSL