Performance and reliability improvement of flash device by a novel programming method

Chia-Huai Ho, Kuei-Shu Chang-Liao, Ya-Nan Huang, Tien-Ko Wang, T. C. Lu. Performance and reliability improvement of flash device by a novel programming method. Microelectronics Reliability, 47(6):967-971, 2007. [doi]

Abstract

Abstract is missing.