Dorit S. Hochbaum. An optimal test compression procedure for combinational circuits. IEEE Trans. on CAD of Integrated Circuits and Systems, 15(10):1294-1299, 1996. [doi]
@article{Hochbaum96,
title = {An optimal test compression procedure for combinational circuits},
author = {Dorit S. Hochbaum},
year = {1996},
doi = {10.1109/43.541449},
url = {http://doi.ieeecomputersociety.org/10.1109/43.541449},
tags = {testing},
researchr = {https://researchr.org/publication/Hochbaum96},
cites = {0},
citedby = {0},
journal = {IEEE Trans. on CAD of Integrated Circuits and Systems},
volume = {15},
number = {10},
pages = {1294-1299},
}