Use of the oscillation based built-in self-test method for smart sensor devices - researchr publication authors

researchr

You are not signed in
Sign in
Sign up

A. Hodge, Robert W. Newcomb, A. Hefner. Use of the oscillation based built-in self-test method for smart sensor devices. In International Symposium on Circuits and Systems (ISCAS 2001), 6-9 May 2001, Sydney, Australia. pages 281-284, IEEE, 2001. [doi]

This author has not been identified. Look up 'A. Hodge' in GoogleThis author has not been identified. Look up 'Robert W. Newcomb' in GoogleThis author has not been identified. Look up 'A. Hefner' in Google

runs on WebDSL