A. Hodge, Robert W. Newcomb, A. Hefner. Use of the oscillation based built-in self-test method for smart sensor devices. In International Symposium on Circuits and Systems (ISCAS 2001), 6-9 May 2001, Sydney, Australia. pages 281-284, IEEE, 2001. [doi]
@inproceedings{HodgeNH01, title = {Use of the oscillation based built-in self-test method for smart sensor devices}, author = {A. Hodge and Robert W. Newcomb and A. Hefner}, year = {2001}, doi = {10.1109/ISCAS.2001.921062}, url = {http://doi.ieeecomputersociety.org/10.1109/ISCAS.2001.921062}, tags = {rule-based, testing}, researchr = {https://researchr.org/publication/HodgeNH01}, cites = {0}, citedby = {0}, pages = {281-284}, booktitle = {International Symposium on Circuits and Systems (ISCAS 2001), 6-9 May 2001, Sydney, Australia}, publisher = {IEEE}, isbn = {0-7803-6685-9}, }