Dale E. Hoffman. Homegrown Tools and Equipment versus EDA and ATE Vendors: The Future of Design to Test Product Lines. In Proceedings IEEE International Test Conference 2002, Baltimore, MD, USA, October 7-10, 2002. pages 26, IEEE Computer Society, 2002. [doi]
@inproceedings{Hoffman02:2,
title = {Homegrown Tools and Equipment versus EDA and ATE Vendors: The Future of Design to Test Product Lines},
author = {Dale E. Hoffman},
year = {2002},
url = {http://csdl.computer.org/comp/proceedings/itc/2002/7543/00/75430026.pdf},
tags = {design science, testing, e-science, design},
researchr = {https://researchr.org/publication/Hoffman02%3A2},
cites = {0},
citedby = {0},
pages = {26},
booktitle = {Proceedings IEEE International Test Conference 2002, Baltimore, MD, USA, October 7-10, 2002},
publisher = {IEEE Computer Society},
}