Julia Hofmockel, Felix Richter, Eric Sax. Automatic Defect Detection by One-Class Classification on Raw Vehicle Sensor Data. In Marzena Kryszkiewicz, Annalisa Appice, Dominik Slezak, Henryk Rybinski, Andrzej Skowron, Zbigniew W. Ras, editors, Foundations of Intelligent Systems - 23rd International Symposium, ISMIS 2017, Warsaw, Poland, June 26-29, 2017, Proceedings. Volume 10352 of Lecture Notes in Computer Science, pages 378-384, Springer, 2017. [doi]
Abstract is missing.