Damien Hogan, Tom Arbuckle, Conor Ryan. Estimating MLC NAND flash endurance: a genetic programming based symbolic regression application. In Christian Blum, Enrique Alba, editors, Genetic and Evolutionary Computation Conference, GECCO '13, Amsterdam, The Netherlands, July 6-10, 2013. pages 1285-1292, ACM, 2013. [doi]
@inproceedings{HoganAR13-0,
title = {Estimating MLC NAND flash endurance: a genetic programming based symbolic regression application},
author = {Damien Hogan and Tom Arbuckle and Conor Ryan},
year = {2013},
doi = {10.1145/2463372.2463537},
url = {http://doi.acm.org/10.1145/2463372.2463537},
researchr = {https://researchr.org/publication/HoganAR13-0},
cites = {0},
citedby = {0},
pages = {1285-1292},
booktitle = {Genetic and Evolutionary Computation Conference, GECCO '13, Amsterdam, The Netherlands, July 6-10, 2013},
editor = {Christian Blum and Enrique Alba},
publisher = {ACM},
isbn = {978-1-4503-1963-8},
}