Tad Hogg, Greg Snider. Defect-tolerant Logic with Nanoscale Crossbar Circuits. J. Electronic Testing, 23(2-3):117-129, 2007. [doi]
@article{HoggS07,
title = {Defect-tolerant Logic with Nanoscale Crossbar Circuits},
author = {Tad Hogg and Greg Snider},
year = {2007},
doi = {10.1007/s10836-006-0547-7},
url = {http://dx.doi.org/10.1007/s10836-006-0547-7},
tags = {logic},
researchr = {https://researchr.org/publication/HoggS07},
cites = {0},
citedby = {0},
journal = {J. Electronic Testing},
volume = {23},
number = {2-3},
pages = {117-129},
}