Some Implications of MSC, SDL and TTCN Time Extensions for Computer-Aided Test Generation

Dieter Hogrefe, Beat Koch, Helmut Neukirchen. Some Implications of MSC, SDL and TTCN Time Extensions for Computer-Aided Test Generation. In Rick Reed, Jeanne Reed, editors, SDL 2001: Meeting UML, 10th International SDL Forum Copenhagen, Denmark, June 27-29, 2001, Proceedings. Volume 2078 of Lecture Notes in Computer Science, pages 168-181, Springer, 2001. [doi]

Abstract

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