2 interfaces investigated by molecular modeling

O. Hölck, J. Bauer, T. Braun, H. Walter, Olaf Wittler, Bernhard Wunderle, K. D. Lang. 2 interfaces investigated by molecular modeling. Microelectronics Reliability, 53(8):1111-1116, 2013. [doi]

Authors

O. Hölck

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J. Bauer

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T. Braun

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H. Walter

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Olaf Wittler

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Bernhard Wunderle

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K. D. Lang

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