O. Hölck, J. Bauer, T. Braun, H. Walter, Olaf Wittler, Bernhard Wunderle, K. D. Lang. 2 interfaces investigated by molecular modeling. Microelectronics Reliability, 53(8):1111-1116, 2013. [doi]
@article{HolckBBWWWL13,
title = {2 interfaces investigated by molecular modeling},
author = {O. Hölck and J. Bauer and T. Braun and H. Walter and Olaf Wittler and Bernhard Wunderle and K. D. Lang},
year = {2013},
doi = {10.1016/j.microrel.2013.02.014},
url = {http://dx.doi.org/10.1016/j.microrel.2013.02.014},
researchr = {https://researchr.org/publication/HolckBBWWWL13},
cites = {0},
citedby = {0},
journal = {Microelectronics Reliability},
volume = {53},
number = {8},
pages = {1111-1116},
}