H. Holler. Measurement and mismatch-modelling of semiconductor devices in BiCMOS technology. In IEEE International Symposium on Circuits and Systems, ISCAS 2000, Emerging Technologies for the 21st Century, Geneva, Switzerland, 28-31 May 2000, Proceedings. pages 373-376, IEEE, 2000. [doi]
@inproceedings{Holler00-0,
title = {Measurement and mismatch-modelling of semiconductor devices in BiCMOS technology},
author = {H. Holler},
year = {2000},
doi = {10.1109/ISCAS.2000.858766},
url = {https://doi.org/10.1109/ISCAS.2000.858766},
researchr = {https://researchr.org/publication/Holler00-0},
cites = {0},
citedby = {0},
pages = {373-376},
booktitle = {IEEE International Symposium on Circuits and Systems, ISCAS 2000, Emerging Technologies for the 21st Century, Geneva, Switzerland, 28-31 May 2000, Proceedings},
publisher = {IEEE},
}