Correctable Erasure Patterns in Product Topologies - researchr publication authors

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Lukas Holzbaur, Sven Puchinger, Eitan Yaakobi, Antonia Wachter-Zeh. Correctable Erasure Patterns in Product Topologies. In IEEE International Symposium on Information Theory, ISIT 2021, Melbourne, Australia, July 12-20, 2021. pages 2054-2059, IEEE, 2021. [doi]

This author has not been identified. Look up 'Lukas Holzbaur' in GoogleThis author has not been identified. Look up 'Sven Puchinger' in GoogleThis author has not been identified. Look up 'Eitan Yaakobi' in GoogleThis author has not been identified. Look up 'Antonia Wachter-Zeh' in Google

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