Correctable Erasure Patterns in Product Topologies

Lukas Holzbaur, Sven Puchinger, Eitan Yaakobi, Antonia Wachter-Zeh. Correctable Erasure Patterns in Product Topologies. In IEEE International Symposium on Information Theory, ISIT 2021, Melbourne, Australia, July 12-20, 2021. pages 2054-2059, IEEE, 2021. [doi]

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