Shi-Zhe Hong, Shen-Li Chen, Tien-Yu Lan, Yu-Jie Zhou, Zhi-Wei Liu, Jhong-Yi Lai. ESD-Immunity Impact of HV pLDMOS with Drain-side Embedded Horizontal P-type Schottky Modulations. In IEEE International Conference on Consumer Electronics-Taiwan, ICCE-TW 2021, Penghu, Taiwan, September 15-17, 2021. pages 1-2, IEEE, 2021. [doi]
Abstract is missing.