Fault Dictionary Size Reduction for Million-Gate Large Circuits - researchr publication authors

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Yu-Ru Hong, Juinn-Dar Huang. Fault Dictionary Size Reduction for Million-Gate Large Circuits. In Proceedings of the 12th Conference on Asia South Pacific Design Automation, ASP-DAC 2007, Yokohama, Japan, January 23-26, 2007. pages 829-834, IEEE, 2007. [doi]

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