Exploiting Same Tag Bits to Improve the Reliability of the Cache Memories

Jeongkyu Hong, Jesung Kim, Soontae Kim. Exploiting Same Tag Bits to Improve the Reliability of the Cache Memories. IEEE Trans. VLSI Syst., 23(2):254-265, 2015. [doi]

@article{HongKK15,
  title = {Exploiting Same Tag Bits to Improve the Reliability of the Cache Memories},
  author = {Jeongkyu Hong and Jesung Kim and Soontae Kim},
  year = {2015},
  doi = {10.1109/TVLSI.2014.2303856},
  url = {http://dx.doi.org/10.1109/TVLSI.2014.2303856},
  researchr = {https://researchr.org/publication/HongKK15},
  cites = {0},
  citedby = {0},
  journal = {IEEE Trans. VLSI Syst.},
  volume = {23},
  number = {2},
  pages = {254-265},
}