A Study on the Transfer Function Based Analog Fault Model for Linear and Time-Invariant Continuous-Time Analog Circuits

Hao-Chiao Hong, Long-Yi Lin. A Study on the Transfer Function Based Analog Fault Model for Linear and Time-Invariant Continuous-Time Analog Circuits. In 25th IEEE Asian Test Symposium, ATS 2016, Hiroshima, Japan, November 21-24, 2016. pages 92-95, IEEE Computer Society, 2016. [doi]

Abstract

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