A run-pause-resume silicon debug technique with cycle granularity for multiple clock domain systems - researchr publication authors

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Shuo-Lian Hong, Kuen-Jong Lee. A run-pause-resume silicon debug technique with cycle granularity for multiple clock domain systems. In IEEE International Test Conference, ITC 2017, Fort Worth, TX, USA, October 31 - Nov. 2, 2017. pages 1-10, IEEE, 2017. [doi]

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