Andreas Höpe, Annette Koo, Francisco Martínez-Verdú, Frédéric B. Leloup, Gaël Obein, Gerd Wübbeler, Joaquín Campos 0001, Paola Iacomussi, Priit Jaanson, Stefan Källberg, Marek Smíd. "Multidimensional reflectometry for industry" (xD-Reflect) an European research project. In Maria V. Ortiz Segovia, Philipp Urban, Jan P. Allebach, editors, Measuring, Modeling, and Reproducing Material Appearance 2014, San Francisco, California, USA, February 2-6, 2014. Volume 9018 of SPIE Proceedings, pages 901804, SPIE, 2014. [doi]
@inproceedings{HopeKMLOWCIJKS14,
title = {"Multidimensional reflectometry for industry" (xD-Reflect) an European research project},
author = {Andreas Höpe and Annette Koo and Francisco Martínez-Verdú and Frédéric B. Leloup and Gaël Obein and Gerd Wübbeler and Joaquín Campos 0001 and Paola Iacomussi and Priit Jaanson and Stefan Källberg and Marek Smíd},
year = {2014},
doi = {10.1117/12.2035981},
url = {https://doi.org/10.1117/12.2035981},
researchr = {https://researchr.org/publication/HopeKMLOWCIJKS14},
cites = {0},
citedby = {0},
pages = {901804},
booktitle = {Measuring, Modeling, and Reproducing Material Appearance 2014, San Francisco, California, USA, February 2-6, 2014},
editor = {Maria V. Ortiz Segovia and Philipp Urban and Jan P. Allebach},
volume = {9018},
series = {SPIE Proceedings},
publisher = {SPIE},
isbn = {9780819499356},
}