Andreas Höpe, Annette Koo, Francisco Martínez-Verdú, Frédéric B. Leloup, Gaël Obein, Gerd Wübbeler, Joaquín Campos 0001, Paola Iacomussi, Priit Jaanson, Stefan Källberg, Marek Smíd. "Multidimensional reflectometry for industry" (xD-Reflect) an European research project. In Maria V. Ortiz Segovia, Philipp Urban, Jan P. Allebach, editors, Measuring, Modeling, and Reproducing Material Appearance 2014, San Francisco, California, USA, February 2-6, 2014. Volume 9018 of SPIE Proceedings, pages 901804, SPIE, 2014. [doi]
Abstract is missing.