An Effective Diagnosis Method to Support Yield Improvement

Camelia Hora, Rene Segers, Stefan Eichenberger, Maurice Lousberg. An Effective Diagnosis Method to Support Yield Improvement. In Proceedings IEEE International Test Conference 2002, Baltimore, MD, USA, October 7-10, 2002. pages 260-269, IEEE Computer Society, 2002. [doi]

@inproceedings{HoraSEL02,
  title = {An Effective Diagnosis Method to Support Yield Improvement},
  author = {Camelia Hora and Rene Segers and Stefan Eichenberger and Maurice Lousberg},
  year = {2002},
  url = {http://csdl.computer.org/comp/proceedings/itc/2002/7543/00/75430260abs.htm},
  researchr = {https://researchr.org/publication/HoraSEL02},
  cites = {0},
  citedby = {0},
  pages = {260-269},
  booktitle = {Proceedings IEEE International Test Conference 2002, Baltimore, MD, USA, October 7-10, 2002},
  publisher = {IEEE Computer Society},
}